آموزش الکترونیک کاربردی جلسه ی 10

Descripción:

The session begins with an introduction at 00:00 and outlines the agenda at 03:36. It then delves into transistor packages and tests, covering BJT tests from 05:14 to 13:35, followed by MOSFET tests from 20:02 to 22:56. The discussion shifts to 7‑segment displays, covering their operation from 32:12 to 37:33. Finally, the session explores various IC packages, including DIP, SMD, QFN, BGY, and BGA types, from 43:14 to 54:02.